World-Class Resources > Metrology Labs > Analytical & Characterization > Digital Instruments Nanoscope III SPM

Atomic resolution
Scanning Probe Microscope (SPM)/AFM
Sample size limited to 1.5 cm X 1.5 cm
Scanning range 125 µm X 125 µm
Contact, tapping, frictional force, magnetic force modes, imaging in liquids
Z < 1 Angstrom

Typical applications: surface roughness, dimensional analyses